第十二届先进陶瓷国际会议
Invited Speakers
A.高温/超高温陶瓷及其复合材料
B.纳米层状三元碳化物/氮化物/硼化物及其2D材料
C.聚合物前驱体陶瓷
D.透明陶瓷与发光材料
E.能源与环保用先进多孔陶瓷
F.陶瓷薄膜与涂层
G.陶瓷基复合材料前沿
H.粉体工艺与烧结前沿
I.3D打印与增材制造进展
J.先进耐火材料与传统陶瓷
K.微波电介质陶瓷
L.储能用介电与铁电材料
M.无铅铁电压电陶瓷
N.面向太阳能电池/LED等应用的钙钛矿材料
O.面向可持续能源利用的热电材料与器件
P.铁电/多铁材料与器件
Q.敏感材料与器件
R.离子及混合传导陶瓷
S.生物陶瓷前沿
T.陶瓷纳米尺度表征
分会主题
T01 Scanning probe microscopy/scanning near-field optical microscopy characterizations of nanoscale electric, piezoelectric, magnetic, thermal and optical properties 
T02 X-ray microscopy, tomography and ptychography based on Bragg diffraction, transmission and fluorescence contrast  
T03 Grain boundary and defects in novel sintering
T04 Ferroelastic, ferroelectric, ferromagnetic domains in piezoelectric, multi-functional, optic and thermal performance
T05 Defects, dislocations and nanoscale ordering in thermoelectrics
T06 Nanoscale phase segregation and transformation in high-temperature and high-entropy ceramics

分会主席
李江宇  南方科技大学 (扫描探针)
顾辉    上海大学 (电子显微)
李千    清华大学 (光学等其他类表征;会务)

组委会成员
高鹏    北京大学 (电子显微)
高翔    北京高压科学研究中心 (电子显微)
王家钧  哈尔滨工业大学 (同步辐射)

Point of Contact:
Qian Li (qianli_mse@tsinghua.edu.cn)

  • 马秀良
    中科院金属所, China
    Topological domains in strained ferroelectric films
  • 何佳清
    南方科技大学, China
    Advanced electron microscopy for thermoelectric materials
  • 高鹏
    北京大学, China
    Four-dimensional electron energy loss spectroscopy for lattice vibration measurement
  • 车仁超
    复旦大学, China
    Microstructure of magnetic absorption materials
  • 田鹤
    浙江大学, China
    Exploring of Charge Mapping in Ferroelectric Materials and Devices
  • 陈春林
    中科院金属所, China
    Atomic and electronic structures of interfaces in iron oxides
  • 喻志阳
    福州大学, China
    Interfaces in hard metals
  • 岳永海
    北京航空航天大学, China
    Design and characterization of nanocomposites with high strength and toughness
  • 黄荣
    华东师范大学, China
    Applicaiton of atomic-scale STEM-EDS analysis in advanced  ceramic materials 
  • 桑夏晗
    武汉理工大学, China
    Accurate real-space nanoscale crystallography using scanning transmission electron microscopy
  • 闫鹏飞
    北京工业大学, China
    to be determined
  • 武海军
    西安交通大学, China
    Microstructural Origins of High Piezoelectric Performance: A Pathway to Practical Lead-Free Materials
  • 高翔
    北京高压科学研究中心, China
    Probing structural origin of enhanced interface conduction in fast-ionic conductors
  • S. Kobayashi
    JFCC , Japan
    Structural analysis based on measurements of slight cation displacements from atomic-scale STEM images
  • 李小燕
    LPS , France
    In-depth studies of functional perovskite thin films atom by atom by high energy and spatial resolution STEM
  • 何迁
    NUS, Singapore
    Electron Microscopy: From Catalyst Discovery to Catalyst by Design
  • G. Pezzotti
    KIT, Japan
    Stress measurements at the nanometric scale
  • 李江宇
    南方科技大学, China
    To be confirmed
  • 刘志
    上海科技大学, China
    In-situ characterization of catalysis system using Synchrotron Radiation
  • 陈立桅
    上海交通大学, China
    How to see’carriers in optoelectronic materials and device
  • 冯军
    南方科技大学, China
    To be confirmed
  • 高兴森
    华南理工大学, China
    Multi-field manipulation of ferroelelectric topological domains and their conductive properties 
  • 王家钧
    哈尔滨工业大学, China
    Advanced characterization techniques for solid-state batteries: synchrotron X-ray microscopy and nuclear magnetic resonance
  • 郭尔佳
    中科院物理所, China
    Nanoscale probe of magnetism in quantum heterostructures
  • 程志海
    中国人民大学, China
    To be confirmed
  • 吕笑梅
    南京大学, China
    Polarization switching and domain wall characteristics in BiFeO3 films
  • 黄博远
    南方科技大学, China
    Data-driven Piezoresponse Force Microscopy for decoupling  competing electromechanical mechanisms
  • 郭杭闻
    复旦大学, China
    Atomic scale characterization & emergment phenomena at complex oxide interfaces
  • 曾华荣
    上海硅酸盐研究所, China
    Nanoscale Chemical imaging and Properties characterization via scanning thermal microscopy
  • 曾开阳
    NUS , Singapore
    Nanoscale Ferroelectric Characterization with Advanced Multi-Frequency Scanning Probe Microscopies
  • Yunseok Kim
    成均馆大学 , 韩国
    Ionically mediated local mechanical deformation associated current flow
  • Seungbum Hong
    KAIST, 韩国
    Reducing Time to Discovery: M3I3 
  • Hugh Simons
    DTU, 丹麦
    To be confirmed
  • 葛炳辉
    安徽大学, China
    structural modulation: long range order and short range order
  • Hugh Simons
    丹麦技术大学, 丹麦
    Imaging multi-scale structural dynamics in ferroelectric ceramics via dark-field x-ray microscopy
U.陶瓷及复合材料的建模与设计
专题首页

Copyright © 2018 . 中国硅酸盐学会版权所有